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Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Title
Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Author
Chhabra, P.S., Lambe, A.T., Canagaratna, M.R., Stark, H., Jayne, J.T., Onasch, T.B., Davidovits, Paul, Kimmel, J.R., Worsnop, D.R.
Date
2015
Genre
article
Version
Version of record.