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Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Title
Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Author
Chhabra, P.S., Lambe, A.T., Canagaratna, M.R., Stark, H., Jayne, J.T., Onasch, T.B., Davidovits, Paul, Kimmel, J.R., Worsnop, D.R.
Date
2015
Genre
article
Version
Version of record.
Single particle characterization using a light scattering module coupled to a time-of-flight aerosol mass spectrometer
Title
Single particle characterization using a light scattering module coupled to a time-of-flight aerosol mass spectrometer
Author
Cross, E.S., Onasch, T.B., Canagaratna, M., Jayne, J.T., Kimmel, J., Yu, X.-Y., Alexander, M.L., Worsnop, D.R., Davidovits, Paul
Date
2009
Genre
article
Version
Version of record.