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Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Single particle characterization using a light scattering module coupled to a time-of-flight aerosol mass spectrometer
Single particle characterization using a light scattering module coupled to a time-of-flight aerosol mass spectrometer

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  • Davidovits, Paul (2) + -
  • Onasch, T.B. (2) + -
  • Worsnop, D.R. (2) + -
  • Alexander, M.L. (1) + -
  • Canagaratna, M. (1) + -
  • Canagaratna, M.R. (1) + -
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2008 - 2016
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Format: 2023/01/28

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