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Title
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Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
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Author
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Chhabra, P.S., Lambe, A.T., Canagaratna, M.R., Stark, H., Jayne, J.T., Onasch, T.B., Davidovits, Paul, Kimmel, J.R., Worsnop, D.R.
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Date
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2015
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Genre
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article
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Version
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Version of record.