Role of boundary roughness in the electronic transport of Bi nanowires

Huber, T.E., A. Nikolaeva, D. Gitsu, L. Konopko, and Michael J. Graf. “Role of boundary roughness in the electronic transport of Bi nanowires”. Journal of Applied Physics, 2008. http://hdl.handle.net/2345/bc-ir:107150.
PREVIEW Datastream
Title
Role of boundary roughness in the electronic transport of Bi nanowires
Author
Huber, T.E.
Nikolaeva, A.
Gitsu, D.
Konopko, L.
Graf, Michael J.
School
Arts and Sciences
Discipline
Physics
Genre
article
Date Issued
2008
Host Title
Journal of Applied Physics
Volume
104
Number
12
General Note
The following article appeared in Huber, T.E., A. Nikolaeva, D. Gitsu, L. Konopko, and M.J. Graf. 2008. "Role of Boundary Roughness in the Electronic Transport of Bi Nanowires." Journal of Applied Physics 104 (12) and may be found at http://dx.doi.org/10.1063/1.3041491.
Record information derived from Scopus (EID: 2-s2.0-58149247754)
Version Identification
Version of record.
Persistent Link
http://hdl.handle.net/2345/bc-ir:107150
Use Restrictions
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.

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