Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products

Chhabra, P.S., A.T. Lambe, M.R. Canagaratna, H. Stark, J.T. Jayne, T.B. Onasch, Paul Davidovits, J.R. Kimmel, and D.R. Worsnop. “Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products”. Atmospheric Measurement Techniques 8, no. 1 (2015): pp. 1-18. http://hdl.handle.net/2345/bc-ir:107123. Note: Version of record.
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