Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products

Chhabra, P.S., A.T. Lambe, M.R. Canagaratna, H. Stark, J.T. Jayne, T.B. Onasch, Paul Davidovits, J.R. Kimmel, and D.R. Worsnop. “Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products”. Atmospheric Measurement Techniques, 2015. http://hdl.handle.net/2345/bc-ir:107123.
PREVIEW Datastream
Title
Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of a-pinene and naphthalene oxidation products
Author
Chhabra, P.S.
Lambe, A.T.
Canagaratna, M.R.
Stark, H.
Jayne, J.T.
Onasch, T.B.
Davidovits, Paul
Kimmel, J.R.
Worsnop, D.R.
School
Arts and Sciences
Discipline
Chemistry
Genre
article
Date Issued
2015
Host Title
Atmospheric Measurement Techniques
Volume
8
Number
1
Pages
pp. 1-18
General Note
Also available on publisher's site: http://dx.doi.org/10.5194/amt-8-1-2015
Record information derived from Scopus (EID: 2-s2.0-84920261058)
Version Identification
Version of record.
Persistent Link
http://hdl.handle.net/2345/bc-ir:107123
Use Restrictions
This work is licensed under the Creative Commons Attribution 3.0 Unported License (https://creativecommons.org/licenses/by/3.0/).

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