Projects in the Design and Construction of a Scanning Tunneling Microscope and UHV Sample Analysis Chamber

Abstract

Three projects have been undertaken during the design and the construction of a scanning tunneling microscope. The first project focuses on a method of testing the movement of piezoelectric ceramics by means of a modified Michelson interferometer. These tests determine the magnitude and the direction of motion on the scale of a few angstroms. These piezos are then used in moving the tip of the STM. The second project concerned the design of a surface analysis chamber to be used for thin film depositions. This chamber will operate at UHV levels and will produce samples to be examined by the STM. The final project dealt with the construction and testing of a feedback loop to be used in the e-beam heater during thin film depositions. This box monitors the current between the sample and the source modifying the voltage across the filament to ensure the current between the two remains constant, ensuring a constant deposition rate.